Scanning Force Microscopy: With Applications to Electric, Magnetic, and Atomic Forces
| AUTHOR | Sarid, Dror |
| PUBLISHER | Oxford University Press (08/25/1994) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
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Product Format
Product Details
ISBN-13:
9780195092042
ISBN-10:
019509204X
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
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Page Count:
288
Carton Quantity:
24
Product Dimensions:
6.45 x 0.87 x 9.63 inches
Weight:
1.50 pound(s)
Feature Codes:
Bibliography,
Index,
Table of Contents,
Illustrated
Country of Origin:
JP
Subject Information
BISAC Categories
Science | Microscopes & Microscopy
Science | Physics - Optics & Light
Science | Electron Microscopes & Microscopy
Dewey Decimal:
502.82
Library of Congress Control Number:
94003081
Descriptions, Reviews, Etc.
publisher marketing
This edition updates the survey of the many rapidly developing subjects concerning the mapping of a variety of forces across surfaces, including basic theory, instrumentation, and applications. It also includes important new research in STM and a thoroughly revised bibliography.
Show More
Author:
Sarid, Dror
Dror Sarid is Professor and former Director of the Optical Data Storage Center at the College of Optical Sciences, the University of Arizona. He participated in the development of the field of surface plasmons, identifying the long- and short-range surface plasmons and their important applications in science and technology.
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Your Price
$376.20