Advances in X-Ray Analysis
| AUTHOR | Huang, T. C.; Gilfrich; Noyan, I. C. |
| PUBLISHER | Kluwer Academic Publishers (10/01/1994) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
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Product Format
Product Details
ISBN-13:
9780306449017
ISBN-10:
0306449013
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
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Page Count:
784
Carton Quantity:
4
Product Dimensions:
7.00 x 1.63 x 10.00 inches
Weight:
3.44 pound(s)
Feature Codes:
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Materials Science - General
Technology & Engineering | Chemistry - Physical & Theoretical
Technology & Engineering | Chemistry - Analytic
Dewey Decimal:
543.085
Library of Congress Control Number:
58035928
Descriptions, Reviews, Etc.
publisher marketing
89 articles organized under the following section heads: Impact of Computers on Xray Analysis. Applications of Whole Pattern Fitting: Structure Determination, Phase Identification, Lattice Parameters. Search/Match Methods, Phase Identification. Diffraction from Single Crystals and Epitaxial Films. Xray Characterization of Films and Surface Layers. Strain and Stress Determination, Xray Fractography, Diffraction Peak Broadening Analysis. Advances in Detectors and Counting Electronics. XRD Techniques and Instrumentation, Nonambient Applications, Texture, other Applications. Xray Optics, Monochromators and Synthetic Multilayers. Total Reflection XRF Applications and Instrumentation, other XRF Techniques and Instrumentation. Mathematical Techniques in Xray Spectrometry. Geological and other Applications of XRS. Index.
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