Back to Search

High Temperature Miniature Specimen Test Methods

AUTHOR Yue, Zhufeng; Sun, Wei; Li, Ming et al.
PUBLISHER Elsevier (10/27/2023)
PRODUCT TYPE Paperback (Paperback)

Description
High Temperature Miniature Specimen Test Methods focuses on a comprehensive and thorough introduction to a range of high temperature, miniaturized test methods at elevated temperatures which are used to obtain "bulk" creep or fatigue properties from a small volume of material. The book will be of use to a wide range of audience of engineers (e.g., designers, manufacturers, metallurgists, stress analysts), researchers (e.g., materials scientists) and students (undergraduate and postgraduate) in the field of high-temperature material and structural integrity assessment. Specific novel features include 1] theoretical basis of each method; 2], data interpretation method of each test, and 3] specific applications.
Show More
Product Format
Product Details
ISBN-13: 9780443218972
ISBN-10: 0443218978
Binding: Paperback or Softback (Trade Paperback (Us))
Content Language: English
More Product Details
Page Count: 286
Carton Quantity: 28
Product Dimensions: 6.00 x 0.60 x 9.00 inches
Weight: 0.85 pound(s)
Country of Origin: US
Subject Information
BISAC Categories
Technology & Engineering | Mechanical
Descriptions, Reviews, Etc.
publisher marketing
High Temperature Miniature Specimen Test Methods focuses on a comprehensive and thorough introduction to a range of high temperature, miniaturized test methods at elevated temperatures which are used to obtain "bulk" creep or fatigue properties from a small volume of material. The book will be of use to a wide range of audience of engineers (e.g., designers, manufacturers, metallurgists, stress analysts), researchers (e.g., materials scientists) and students (undergraduate and postgraduate) in the field of high-temperature material and structural integrity assessment. Specific novel features include 1] theoretical basis of each method; 2], data interpretation method of each test, and 3] specific applications.
Show More
Your Price  $178.20
Paperback