Advances in Optics of Charged Particle Analyzers: Part 2: Volume 233
| PUBLISHER | Academic Press (05/21/2025) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
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Product Format
Product Details
ISBN-13:
9780443317200
ISBN-10:
0443317208
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
298
Carton Quantity:
14
Product Dimensions:
6.37 x 0.61 x 9.28 inches
Weight:
1.34 pound(s)
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Signals & Signal Processing
Technology & Engineering | Electronics - Microelectronics
Technology & Engineering | Mechanical
Descriptions, Reviews, Etc.
publisher marketing
Advances in Optics of Charged Particle Analyzers: Part Two, Volume 233 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The release in the series features articles on Electrostatic Energy, Mass Analyzers With Combined Electrostatic and Magnetic Fields, Mass Analyzers based on Fourier Transform, Principles of Time-of-Flight Mass Analyzers, Multi-Pass Time-of-Flight Mass Analyzers, and Radiofrequency Mass Analyzers.
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Your Price
$242.55