Built in Test for VLSI: Pseudorandom Techniques
| AUTHOR | Savir, J.; McAnney, W. H.; Bardell, Paul H. et al. |
| PUBLISHER | Wiley-Interscience (10/20/1987) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students alike. It opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, reviewing by comparison the principles of design for testability of more advanced digital technology. It then offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing; and various data compression methods, such as polynomial dividers and unique shift-register sequence generators with special applications.
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Product Format
Product Details
ISBN-13:
9780471624639
ISBN-10:
0471624632
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
368
Carton Quantity:
22
Product Dimensions:
6.39 x 0.88 x 9.58 inches
Weight:
1.46 pound(s)
Feature Codes:
Index
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electronics - General
Dewey Decimal:
621.381
Library of Congress Control Number:
87023013
Descriptions, Reviews, Etc.
publisher marketing
This handbook provides ready access to all of the major concepts, techniques, problems and solutions in the emerging field of pseudorandom pattern testing. Until now, the literature in this area has been widely scattered, and published work, written by professionals in several disciplines, has treated notation and mathematics in ways that vary from source to source. The main intention of this book is to present the material in a unified manner, making it a useful source for practising professionals and students alike. It opens with a clear description of the shortcomings of conventional testing as applied to complex digital circuits, reviewing by comparison the principles of design for testability of more advanced digital technology. It then offers in-depth discussions of test sequence generation and response data compression, including pseudorandom sequence generators; the mathematics of shift-register sequences and their potential for built-in testing; and various data compression methods, such as polynomial dividers and unique shift-register sequence generators with special applications.
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List Price $281.95
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