Back to Search

Electron Microscopy of Interfaces in Metals and Alloys

AUTHOR Forwood, C. T.; Forwood, C. T.; Forwood, C. T. et al.
PUBLISHER Routledge (01/01/1991)
PRODUCT TYPE Hardcover (Hardcover)

Description
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Show More
Product Format
Product Details
ISBN-13: 9780750301169
ISBN-10: 0750301163
Binding: Hardback or Cased Book (Sewn)
Content Language: English
More Product Details
Page Count: 434
Carton Quantity: 10
Product Dimensions: 6.20 x 1.10 x 9.30 inches
Weight: 1.85 pound(s)
Feature Codes: Illustrated
Country of Origin: US
Subject Information
BISAC Categories
Technology & Engineering | Materials Science - General
Technology & Engineering | Microscopes & Microscopy
Technology & Engineering | Electrical
Dewey Decimal: 620.169
Library of Congress Control Number: 90029110
Descriptions, Reviews, Etc.
publisher marketing
Electron Microscopy of Interfaces in Metals and Alloys examines the structure of interfaces in metals and alloys using transmission electron microscopy. The book presents quantitative methods of analysis and reviews the most significant work on interface structure over the last 20 years. It provides the first book description of the methods used for quantitative identification of Burgers vectors of interfacial dislocations, including the geometric analysis of periodicities in interface structure and the comparison of experimental and theoretical electron micrographs. The book explores low- and high-angle grain boundaries and interphase interfaces between neighboring grains, emphasizing interfacial dislocations and rigid-body displacements to the structure and properties of interfaces. It also analyzes the use of two-beam images and diffraction patterns for analysis and studies n-beam lattice imaging. The book includes numerous worked examples of the analysis of the structure of grain boundaries and interphase interfaces, which are particularly useful to those who need to consider the nature of intercrystalline interfaces.
Show More
List Price $425.00
Your Price  $420.75
Hardcover