Delay Fault Testing for VLSI Circuits
| AUTHOR | Kwang-Ting (Tim) Cheng; Krstic, Angela |
| PUBLISHER | Springer (10/31/1998) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
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Product Format
Product Details
ISBN-13:
9780792382959
ISBN-10:
0792382951
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
191
Carton Quantity:
38
Product Dimensions:
6.14 x 0.50 x 9.21 inches
Weight:
1.05 pound(s)
Feature Codes:
Bibliography,
Index,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Computers | Logic Design
Computers | Electrical
Computers | Design, Graphics & Media - CAD-CAM
Dewey Decimal:
621.395
Library of Congress Control Number:
98039137
List Price $169.99
Your Price
$168.29