Testability Concepts for Digital ICS: The Macro Test Approach
| AUTHOR | Beenker, F. P. M.; Thijssen, A. P.; Bennetts, R. G. |
| PUBLISHER | Springer (11/30/1995) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
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Product Format
Product Details
ISBN-13:
9780792396581
ISBN-10:
0792396588
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
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Page Count:
212
Carton Quantity:
34
Product Dimensions:
6.14 x 0.56 x 9.21 inches
Weight:
1.10 pound(s)
Feature Codes:
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electrical
Technology & Engineering | Electronics - Circuits - General
Dewey Decimal:
621.3
Library of Congress Control Number:
95040166
List Price $169.99
Your Price
$168.29