From Contamination to Defects, Faults and Yield Loss: Simulation and Applications
| AUTHOR | Khare, Jitendra B.; Maly, Wojciech |
| PUBLISHER | Springer (04/30/1996) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
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Product Format
Product Details
ISBN-13:
9780792397144
ISBN-10:
0792397142
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
150
Carton Quantity:
44
Product Dimensions:
6.14 x 0.44 x 9.21 inches
Weight:
0.92 pound(s)
Feature Codes:
Bibliography,
Index,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electronics - Semiconductors
Technology & Engineering | Electrical
Technology & Engineering | Design, Graphics & Media - CAD-CAM
Dewey Decimal:
621.381
Library of Congress Control Number:
96005441
List Price $109.99
Your Price
$108.89