(Ipf)Microelectronic Reliability
| AUTHOR | Hakim, Edward B.; Hakim, Edward B.; Hakim, Edward B. |
| PUBLISHER | Artech House Publishers (01/31/1989) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
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Product Format
Product Details
ISBN-13:
9780890062845
ISBN-10:
0890062846
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
396
Carton Quantity:
18
Product Dimensions:
6.34 x 1.17 x 9.37 inches
Weight:
1.70 pound(s)
Feature Codes:
Index,
Table of Contents,
Glossary,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electronics - Semiconductors
Dewey Decimal:
621.381
Library of Congress Control Number:
88-7814
Descriptions, Reviews, Etc.
publisher marketing
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Show More
List Price $155.00
Your Price
$153.45