Kinetic Studies in GeO2/Ge System: A Retrospective from 2021
| AUTHOR | Wang, Sheng-Kai |
| PUBLISHER | CRC Press (06/14/2022) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
This title investigates reaction kinetics in GeO2/Ge systems, aiming to demonstrate the fundamentals of the GeO2/Ge interface and to give insight into the distinctive features and performance of Ge (germanium) applied to advanced complementary metal oxide semiconductor (CMOS) devices.
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Product Format
Product Details
ISBN-13:
9781032257440
ISBN-10:
103225744X
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
134
Carton Quantity:
38
Product Dimensions:
6.00 x 0.44 x 9.00 inches
Weight:
0.84 pound(s)
Feature Codes:
Bibliography,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electrical
Technology & Engineering | Electronics - Semiconductors
Technology & Engineering | Materials Science - Electronic Materials
Dewey Decimal:
621.397
Library of Congress Control Number:
2021055725
Descriptions, Reviews, Etc.
publisher marketing
This title investigates reaction kinetics in GeO2/Ge systems, aiming to demonstrate the fundamentals of the GeO2/Ge interface and to give insight into the distinctive features and performance of Ge (germanium) applied to advanced complementary metal oxide semiconductor (CMOS) devices.
Show More
List Price $150.00
Your Price
$148.50