Scanning Probe Microscopy?in Industrial Applications: Nanomechanical Characterization
| PUBLISHER | Wiley (11/20/2013) |
| PRODUCT TYPE | Software (Other) |
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Product Details
ISBN-13:
9781118723111
ISBN-10:
1118723112
Content Language:
English
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Carton Quantity:
0
Feature Codes:
Glossary
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Nanotechnology & MEMS
Technology & Engineering | Microscopes & Microscopy
Dewey Decimal:
502.82
List Price $133.00
Your Price
$131.67