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Characterization of Nanostructures

AUTHOR Rivire, John C.; Myhra, Sverre; Riviere, John C.
PUBLISHER CRC Press (10/26/2016)
PRODUCT TYPE Paperback (Paperback)

Description

Divided into two parts, this book provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures and discusses typical applications to single nanoscale objects, as well as ensembles of such objects. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial troubleshooting, and online analysis. They describe operational modes most relevant to nanoscale characterization, and offer unique content on systems of different dimensionalities and functionalities.

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Product Details
ISBN-13: 9781138198630
ISBN-10: 1138198633
Binding: Paperback or Softback (Trade Paperback (Us))
Content Language: English
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Page Count: 366
Carton Quantity: 22
Product Dimensions: 6.14 x 0.73 x 9.21 inches
Weight: 1.09 pound(s)
Feature Codes: Illustrated
Country of Origin: US
Subject Information
BISAC Categories
Science | Chemistry - Analytic
Science | Materials Science - General
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Divided into two parts, this book provides thumbnail sketches of the most widely used techniques and methods that apply to nanostructures and discusses typical applications to single nanoscale objects, as well as ensembles of such objects. The authors focus on the needs in the research laboratory but also address the needs of quality control, industrial troubleshooting, and online analysis. They describe operational modes most relevant to nanoscale characterization, and offer unique content on systems of different dimensionalities and functionalities.

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List Price $96.99
Your Price  $96.02
Paperback