Pattern Recognition and Machine Learning: Proceedings of the Japan--U.S. Seminar on the Learning Process in Control Systems, Held in Nagoya, Japan Aug
| PUBLISHER | Springer (12/12/2012) |
| PRODUCT TYPE | Paperback (Paperback) |
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Product Format
Product Details
ISBN-13:
9781461575689
ISBN-10:
1461575680
Binding:
Paperback or Softback (Trade Paperback (Us))
Content Language:
English
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Page Count:
344
Carton Quantity:
11
Product Dimensions:
7.00 x 0.74 x 10.00 inches
Weight:
1.36 pound(s)
Feature Codes:
Illustrated
Country of Origin:
NL
Subject Information
BISAC Categories
Reference | Questions & Answers
Reference | Chemistry - Computational & Molecular Modeling
Reference | Artificial Intelligence - Computer Vision & Pattern Recognit
Dewey Decimal:
001.533
Descriptions, Reviews, Etc.
Editor:
Fu, King-Sun
Fu, School of Electrical Engineering, Purdue University, West Lafayette, Indiana.
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List Price $129.99
Your Price
$128.69