Reliability and Failure of Electronic Materials and Devices
| AUTHOR | Ohring, Milton |
| PUBLISHER | Academic Press (06/12/1998) |
| PRODUCT TYPE | Paperback (Paperback) |
Description
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Product Format
Product Details
ISBN-13:
9781493301737
ISBN-10:
149330173X
Binding:
Paperback or Softback (Trade Paperback (Us))
Content Language:
English
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Page Count:
692
Carton Quantity:
12
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electrical
Technology & Engineering | Materials Science - General
Technology & Engineering | Quality Control
Dewey Decimal:
621.381
Descriptions, Reviews, Etc.
Author:
Ohring, Milton
Ohring has been professor of Materials Science and engineering at Stevens Institute of Technology for more than 30 years.
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List Price $175.00
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$173.25