Recent Developments in Atomic Force Microscopy and Raman Spectroscopy for Materials Characterization
| PUBLISHER | Intechopen (01/07/2022) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
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Product Format
Product Details
ISBN-13:
9781839682292
ISBN-10:
1839682299
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
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Page Count:
276
Carton Quantity:
18
Product Dimensions:
6.69 x 0.69 x 9.61 inches
Weight:
1.41 pound(s)
Country of Origin:
US
Subject Information
BISAC Categories
Science | Physics - Condensed Matter
Descriptions, Reviews, Etc.
publisher marketing
This book contains chapters that describe advanced atomic force microscopy (AFM) modes and Raman spectroscopy. It also provides an in-depth understanding of advanced AFM modes and Raman spectroscopy for characterizing various materials. This volume is a useful resource for a wide range of readers, including scientists, engineers, graduate students, postdoctoral fellows, and scientific professionals working in specialized fields such as AFM, photovoltaics, 2D materials, carbon nanotubes, nanomaterials, and Raman spectroscopy.
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List Price $155.00
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$153.45