Datums and Map Projections for Remote Sensing, GIS and Surveying
| AUTHOR | Iliffe, Jonathan; Lott, Roger |
| PUBLISHER | Whittles (04/01/2008) |
| PRODUCT TYPE | Paperback (Paperback) |
Description
Show More
Product Format
Product Details
ISBN-13:
9781904445470
ISBN-10:
1904445470
Binding:
Paperback or Softback (Trade Paperback (Us))
Content Language:
English
Edition Number:
0002
More Product Details
Page Count:
224
Carton Quantity:
1
Product Dimensions:
6.10 x 0.50 x 9.20 inches
Weight:
0.97 pound(s)
Feature Codes:
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Remote Sensing & Geographic Information Systems
Technology & Engineering | Earth Sciences - Geography
Technology & Engineering | Cartography
Dewey Decimal:
526.82
List Price $65.00
Your Price
$64.35