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NASA Formal Methods: 7th International Symposium, Nfm 2015, Pasadena, Ca, Usa, April 27-29, 2015, Proceedings

PUBLISHER Springer (04/09/2015)
PRODUCT TYPE Paperback (Paperback)

Description

This book constitutes the refereed proceedings of the 7th International Symposium on NASA Formal Methods, NFM 2015, held in Pasadena, CA, USA, in April 2015.

The 24 revised regular papers presented together with 9 short papers were carefully reviewed and selected from 108 submissions. The topics include model checking, theorem proving; SAT and SMT solving; symbolic execution; static analysis; runtime verification; systematic testing; program refinement; compositional verification; security and intrusion detection; modeling and specification formalisms; model-based development; model-based testing; requirement engineering; formal approaches to fault tolerance; and applications of formal methods.

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Product Format
Product Details
ISBN-13: 9783319175232
ISBN-10: 3319175238
Binding: Paperback or Softback (Trade Paperback (Us))
Content Language: English
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Page Count: 458
Carton Quantity: 16
Product Dimensions: 6.14 x 0.95 x 9.21 inches
Weight: 1.45 pound(s)
Feature Codes: Illustrated
Country of Origin: NL
Subject Information
BISAC Categories
Computers | Software Development & Engineering - General
Computers | Languages - General
Computers | Operating Systems - General
Dewey Decimal: 005.1
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This book constitutes the refereed proceedings of the 7th International Symposium on NASA Formal Methods, NFM 2015, held in Pasadena, CA, USA, in April 2015.

The 24 revised regular papers presented together with 9 short papers were carefully reviewed and selected from 108 submissions. The topics include model checking, theorem proving; SAT and SMT solving; symbolic execution; static analysis; runtime verification; systematic testing; program refinement; compositional verification; security and intrusion detection; modeling and specification formalisms; model-based development; model-based testing; requirement engineering; formal approaches to fault tolerance; and applications of formal methods.

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Your Price  $54.44
Paperback