ISBN 9783527410668 is out of print and is currently unavailable, alternate formats (if applicable) are shown below.
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Mechanical Stress on the Nanoscale: Simulation, Material Systems and Characterization Techniques (Out of print)
| PUBLISHER | Wiley-Vch (12/12/2011) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
Show More
Product Format
Product Details
ISBN-13:
9783527410668
ISBN-10:
352741066X
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
380
Carton Quantity:
20
Product Dimensions:
6.90 x 0.90 x 9.70 inches
Weight:
1.85 pound(s)
Country of Origin:
DE
Subject Information
BISAC Categories
Technology & Engineering | Materials Science - Electronic Materials
Technology & Engineering | Nanoscience
Dewey Decimal:
620.115
Descriptions, Reviews, Etc.
jacket back
Bringing together experts from the various disciplines involved, this first comprehensive overview of the current level of stress engineering on the nanoscale is unique in combining the theoretical fundamentals with simulation methods, model systems and characterization techniques.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
Essential reading for researchers in microelectronics, optoelectronics, sensing, and photonics.
Show More
List Price $166.95
Your Price
$165.28