This reprint focuses on various types of surface topography descriptions. Since the detailed analysis of surface topography influences many material layer property evaluations, its proper study rely on both data collection and processing. Many errors occur not only when the measuring instrument is forwarding but also when the received data are processed. Therefore, the whole surface topography evaluation process depends on each of the actions provided. This reprint provides an insight on how to determine a proper description of a surface by examining its topography. The variety of studies regarding surface topography in each of the chapters included can provide advantages for resolving different problems of surface metrology.