Metody Povysheniya Nadyezhnosti Mikroskhem Na Osnove Testovykh Struktur
| AUTHOR | Turtsevich Arkadiy; Belous Anatoliy; Chigir' Grigoriy |
| PUBLISHER | LAP Lambert Academic Publishing (04/06/2012) |
| PRODUCT TYPE | Paperback (Paperback) |
Description
V monografii detal'no rassmotrena sistema testovogo kontrolya kachestva tekhnologicheskogo protsessa izgotovleniya mikroskhem, protsedura obrabotki dannykh i modelirovaniya vykhoda godnykh kristallov IMS. Osoboe znachenie udeleno metodam otsenki nadezhnosti kristallov mikroskhem v sostave plastin na etape tekhnologicheskogo protsessa izgotovleniya IMS, pozvolyayushchikh optimizirovat' protsessy i obespechit' vysokiy uroven' nadezhnosti korpusirovannykh mikroskhem. Privedeny rezul'taty issledovaniy nadyezhnosti mnogosloynykh tonkoplyenochnykh sistem metallizatsii, konkretnye rezul'taty prakticheskogo primeneniya ryada metodov vyyavleniya i otbrakovki korpusirovannykh mikroskhem so skrytymi defektami: analiz dinamicheskogo toka potrebleniya, vozdeystviya impul'sov staticheskogo elektrichestva, termotsiklirovaniya, povyshennogo napryazheniya pitaniya. Kniga prednaznachena dlya spetsialistov elektronnoy i radioelektronnoy promyshlennosti, a takzhe studentov i aspirantov vuzov sootvetstvuyushchey spetsial'nosti.
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Product Format
Product Details
ISBN-13:
9783848431076
ISBN-10:
3848431076
Binding:
Paperback or Softback (Trade Paperback (Us))
Content Language:
Russian
More Product Details
Page Count:
248
Carton Quantity:
32
Product Dimensions:
6.00 x 0.56 x 9.00 inches
Weight:
0.81 pound(s)
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electronics - General
Descriptions, Reviews, Etc.
publisher marketing
V monografii detal'no rassmotrena sistema testovogo kontrolya kachestva tekhnologicheskogo protsessa izgotovleniya mikroskhem, protsedura obrabotki dannykh i modelirovaniya vykhoda godnykh kristallov IMS. Osoboe znachenie udeleno metodam otsenki nadezhnosti kristallov mikroskhem v sostave plastin na etape tekhnologicheskogo protsessa izgotovleniya IMS, pozvolyayushchikh optimizirovat' protsessy i obespechit' vysokiy uroven' nadezhnosti korpusirovannykh mikroskhem. Privedeny rezul'taty issledovaniy nadyezhnosti mnogosloynykh tonkoplyenochnykh sistem metallizatsii, konkretnye rezul'taty prakticheskogo primeneniya ryada metodov vyyavleniya i otbrakovki korpusirovannykh mikroskhem so skrytymi defektami: analiz dinamicheskogo toka potrebleniya, vozdeystviya impul'sov staticheskogo elektrichestva, termotsiklirovaniya, povyshennogo napryazheniya pitaniya. Kniga prednaznachena dlya spetsialistov elektronnoy i radioelektronnoy promyshlennosti, a takzhe studentov i aspirantov vuzov sootvetstvuyushchey spetsial'nosti.
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