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Metrology and Diagnostic Techniques for Nanoelectronics

PUBLISHER Jenny Stanford Publishing (10/03/2016)
PRODUCT TYPE Hardcover (Hardcover)

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ISBN-13: 9789814745086
ISBN-10: 9814745081
Binding: Hardback or Cased Book (Sewn)
Content Language: English
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Page Count: 1454
Carton Quantity: 8
Country of Origin: US
Subject Information
BISAC Categories
Science | Physics - General
Science | Materials Science - General
Science | Life Sciences - General
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Editor: Seiler, David G.
David G. Seiler
David G. Seiler, Ph.D., is chief of the Semiconductor Electronics Division, Electronics and Electrical Engineering Laboratory, at the National Institute of Standards and Technology in Gaithersburg, Maryland. He lives in Maryland and was recently selected to receive a Purdue School of Science Distinguished Alumni Award.
Laurel S. Brunvoll
Laurel Seiler Brunvoll is owner of Writing Solutions, a writing and public relations firm based in Maryland. She has had more than 650 articles published in both national and local magazines and newspapers. She lives in Maryland with her husband Steven and two sons.
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List Price $520.00
Your Price  $514.80
Hardcover