Design and Test Technology for Dependable Systems-on-Chip
| PUBLISHER | Information Science Reference (03/31/2011) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.
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Product Format
Product Details
ISBN-13:
9781609602123
ISBN-10:
1609602129
Binding:
Hardback or Cased Book (Unsewn / Adhesive Bound)
Content Language:
English
More Product Details
Page Count:
580
Carton Quantity:
7
Product Dimensions:
8.60 x 1.40 x 11.20 inches
Weight:
3.55 pound(s)
Feature Codes:
Bibliography,
Index,
Table of Contents,
Illustrated
Country of Origin:
US
Subject Information
BISAC Categories
Computers | Software Development & Engineering - Systems Analysis & Desi
Computers | Internet - Web Design
Dewey Decimal:
621.381
Library of Congress Control Number:
2010045850
Descriptions, Reviews, Etc.
publisher marketing
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.
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List Price $180.00
Your Price
$178.20