Ellipsometry: Principles and Techniques for Materials Characterization
| PUBLISHER | Intechopen (11/29/2017) |
| PRODUCT TYPE | Hardcover (Hardcover) |
Description
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
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Product Format
Product Details
ISBN-13:
9789535136231
ISBN-10:
9535136232
Binding:
Hardback or Cased Book (Sewn)
Content Language:
English
More Product Details
Page Count:
162
Carton Quantity:
38
Product Dimensions:
6.69 x 0.44 x 9.61 inches
Weight:
1.02 pound(s)
Country of Origin:
US
Subject Information
BISAC Categories
Technology & Engineering | Electronics - Optoelectronics
Descriptions, Reviews, Etc.
publisher marketing
Ellipsometry is rapidly emerging as a popular solution addressed to new materials science challenges and technological pitfalls hindering its effective application on modern problems. Amid the nowadays active development of materials of top notch, ellipsometry is also evolving rapidly both in the academic and industry sectors. The global industry strategies, introduce the latest scientific advances at manufacturing new, more accurate, and reliable ellipsometry systems to tackle emerging challenges. The book provides a comprehensive overview on the principles and technical capabilities of the modern ellipsometry highlighting its versatility in materials characterization.
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List Price $155.00
Your Price
$153.45
