Logic Testing and Design for Testability
| AUTHOR | Fujiwara, Hideo |
| PUBLISHER | MIT Press (07/31/1985) |
| PRODUCT TYPE | Paperback (Paperback) |
Description
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Product Format
Product Details
ISBN-13:
9780262561990
ISBN-10:
0262561999
Binding:
Paperback or Softback (Trade Paperback (Us))
Content Language:
English
More Product Details
Page Count:
284
Carton Quantity:
26
Product Dimensions:
5.90 x 0.80 x 8.90 inches
Weight:
0.90 pound(s)
Feature Codes:
Bibliography,
Index,
Table of Contents
Country of Origin:
US
Subject Information
BISAC Categories
Computers | Computer Science
Grade Level:
College Freshman
and up
Dewey Decimal:
004
Your Price
$34.65